US Patent Issued to Synopsys on Nov. 25 for "Test point insertion in analog circuit design testing" (California Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,481,813, issued on Nov. 25, was assigned to Synopsys Inc. (Sunnyvale, Calif.).

"Test point insertion in analog circuit design testing" was invented by Mayukh Bhattacharya (Palo Alto, Calif.) and Peilin Jiang (SAnta Clara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for inserting test points during circuit design testing are presented. The method includes partitioning a circuit design into a plurality of blocks and determining a first potential defect and a second potential defect for the circuit design. The method also includes simulating the circuit design by injecting, into the circuit design, the first potential defect t...