US Patent Issued to Suzhou Institute of Biomedical Engineering and Technology, Chinese Academy of Sciences on Dec. 2 for "Anisoplanatic aberration correction method and apparatus for adaptive optical linear beam scanning imaging" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,442, issued on Dec. 2, was assigned to Suzhou Institute of Biomedical Engineering and Technology, Chinese Academy of Sciences (Suzhou, China).

"Anisoplanatic aberration correction method and apparatus for adaptive optical linear beam scanning imaging" was invented by Yi He (Suzhou, China), Yiwei Chen (Suzhou, China), Lina Xing (Suzhou, China), Wen Kong (Suzhou, China) and Guohua Shi (Suzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An anisoplanatic aberration correction method and apparatus for adaptive optical linear beam scanning imaging. The method comprises: in an adaptive optical linear beam scanning imaging system, performing tempor...