ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,779,247, issued on Nov. 3, was assigned to SUMITOMO HEAVY INDUSTRIES LTD. (Tokyo).
"Charged particle beam irradiation system" was invented by Takashi Yamaguchi (Kanagawa, Japan), Shouhei Mizutani (Kanagawa, Japan), Masayuki Araya (Nagano, Japan) and Yuya Sugama (Nagano, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A charged particle beam irradiation system irradiating an irradiation target in an object with a charged particle beam, includes a scanning electromagnet, an irradiator irradiating the irradiation target with the charged particle beam by performing scanning with the charged particle beam with the scanning electromagnet, an adjusting mem...