ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,734, issued on Jan. 20, was assigned to Sumitomo Electric Industries Ltd. (Osaka, Japan).

"Electromagnetic field analysis method, electromagnetic field analysis apparatus, and storage medium" was invented by Takeshi Kawasaki (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electromagnetic field analysis method includes generating meshes so that a first mesh is generated in a first region and no mesh or a second mesh is generated in a second region other than the first region in a coplanar waveguide, the coplanar waveguide including a dielectric layer and a conductor pattern having a signal line and reference potential patterns, the fi...