US Patent Issued to STMICROELECTRONICS on July 7 for "System and method for fast magnetometer calibration using gyroscope" (California Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,850, issued on July 7, was assigned to STMICROELECTRONICS INC. (Coppell, Texas).

"System and method for fast magnetometer calibration using gyroscope" was invented by Mahaveer Jain (Milpitas, Calif.) and Mahesh Chowdhary (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device includes a magnetometer that outputs magnetometer sensor signals and a gyroscope that outputs gyroscope sensor signals. The electronic device includes a magnetometer calibration module that calibrates the magnetometer utilizing the gyroscope sensor signals. The electronic device generates a first magnetometer calibration parameter based on a Kalman ...