US Patent Issued to STMicroelectronics International on March 17 for "Scan-testable electronic circuit and corresponding method of testing an electronic circuit" (Italian Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,385, issued on March 17, was assigned to STMicroelectronics International N.V. (Geneva).

"Scan-testable electronic circuit and corresponding method of testing an electronic circuit" was invented by Andrea Floridia (Catania, Italy) and Michelangelo Massimo Maria Grosso (Turin, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scan-testable integrated circuit includes a logic circuit configured to receive test mode control signals, a signal interface configured to receive scan-in, scan enable and scan clock signals, and produce a scan-out signal, and a scan register including a plurality of scan cells coupled to the signal interface to receive t...