US Patent Issued to STMicroelectronics International on Dec. 16 for "Device and method for time skew calibration of multi channel ADC" (Indian Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,500,592, issued on Dec. 16, was assigned to STMicroelectronics International N.V. (Geneva).

"Device and method for time skew calibration of multi channel ADC" was invented by Ankur Bal (Greater Noida, India) and Jeet Narayan Tiwari (Greater Noida, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes a plurality of ADC channels. During a calibration process of the ADC channels, the integrated circuit utilizes derivative filters to calculate a phase difference between the ADC channels. During a calibration process, the integrated circuit utilizes clock phase alignment circuits to align the phases of the ADC channels based on...