US Patent Issued to STMICROELECTRONICS (BEIJING) R&D, STMicroelectronics (Grenoble 2), STMICROELECTRONICS on May 26 for "Method and device of distance measurement by time-of-flight calculation with wraparound" (Chinese, French Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,590, issued on May 26, was assigned to STMICROELECTRONICS (BEIJING) R&D Co. LTD. (Beijing), STMicroelectronics (Grenoble 2) SAS (Grenoble, France) and STMICROELECTRONICS LTD (Kowloon, Hong Kong).

"Method and device of distance measurement by time-of-flight calculation with wraparound" was invented by Etienne Bossart (Claix, France), Ji Nan Li (Shenzhen, China), Cedric Patrick Jean Claude Colombo (Hong Kong) and Thomas Perotto (Grenoble, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure concerns a method of measuring the distance between a device and an object comprising the steps of determination of a first estimated distan...