ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,412,103, issued on Sept. 9, was assigned to SPLUNK LLC (San Jose, Calif.).

"Monitoring and visualization of model-based clustering definition performance" was invented by Yanpei Chen (Sunnyvale, Calif.) and Archana Ganapathi (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "This document discloses methods and systems for cohort identification. The methods and systems include improved calculations to perform cohort identification and practical applications of the improved calculations. Specifically, the systems and methods described herein may utilize key components that include enhancements of existing cohort clustering techniques with ...