US Patent Issued to SOYO DENSHI on July 28 for "Erroneous wiring inspection device" (Japanese Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,330, issued on July 28, was assigned to SOYO DENSHI Co. LTD. (Mie, Japan).

"Erroneous wiring inspection device" was invented by Shinji Nakane (Aichi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided an erroneous wiring inspection device that can prevent false diagnoses due to current bypass. The erroneous wiring inspection device determines a resistance value and whether or not there is a phase difference based on the measured voltage and the measured current, while an AC generating circuit applies an AC signa. If the resistance value is equal to or greater than a predetermined value, the device stops a first reporting circuit ...