US Patent Issued to SOUTHEAST UNIVERSITY on Dec. 16 for "Statistical timing analysis method of integrated circuit under advanced process and low voltage" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,299, issued on Dec. 16, was assigned to SOUTHEAST UNIVERSITY (Nanjing, China).

"Statistical timing analysis method of integrated circuit under advanced process and low voltage" was invented by Peng Cao (Nanjing, China), Tai Yang (Nanjing, China) and Jingjing Guo (Nanjing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "It discloses a statistical timing analysis method of an integrated circuit under an advanced process and a low voltage. By simulating the fluctuation of process parameters of the integrated circuit under the advanced process, a statistical circuit timing model is built based on the relationship between the delay of the integrated...