US Patent Issued to SOOCHOW UNIVERSITY on June 23 for "Method of wavenumber linearity dispersion optical system and imaging spectrometer" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,638, issued on June 23, was assigned to SOOCHOW UNIVERSITY (Suzhou, China).

"Method of wavenumber linearity dispersion optical system and imaging spectrometer" was invented by Jian Bao (Suzhou, China), Qiuyang Shen (Suzhou, China), Xinhua Chen (Suzhou, China) and Weimin Shen (Suzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention discloses a design method of a wavenumber linearity dispersion optical system and an imaging spectrometer, including: building an optical system including a grating, a prism and an objective lens that are sequentially arranged, the grating adjoins the prism; defining a linearity evaluation coefficient RM...