US Patent Issued to SONY SEMICONDUCTOR SOLUTIONS on March 3 for "Semiconductor device and cell potential measuring device" (Japanese Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,151, issued on March 3, was assigned to SONY SEMICONDUCTOR SOLUTIONS Corp. (Kanagawa, Japan).

"Semiconductor device and cell potential measuring device" was invented by Yuri Kato (Kanagawa, Japan) and Koji Ogawa (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a semiconductor device and a cell potential measuring device capable of improving measurement accuracy of a potential of a solution. A semiconductor device includes a read electrode that reads a potential of a solution, a differential amplifier, a first capacitor connected in series in a loop feeding back an output of the differential amplifier ...