US Patent Issued to Sonix on Dec. 23 for "Method and apparatus for automated defect detection" (Maryland, Oregon, Texas, Ohio Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,532, issued on Dec. 23, was assigned to Sonix Inc. (Springfield, Va.).

"Method and apparatus for automated defect detection" was invented by Kevin Ryan (Silver Spring, Md.), John J. Pickerd (Hillsboro, Ore.), Sam J. Strickling (Cypress, Texas) and Jeffrey J. Trgovich (Macedonia, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a method and apparatus for automated inspection, an image is acquired of an object under inspection and a difference image is generated showing the difference between the acquired image and a reference image of a defect-free object of the same type. Characteristics of the difference image, or detected isolated regions of...