US Patent Issued to Soitec on March 31 for "Resonator device for measuring stress including at least two resonators each having a transducer between reflecting structures with a shared cavity" (French Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,854, issued on March 31, was assigned to Soitec (Bernin, France).

"Resonator device for measuring stress including at least two resonators each having a transducer between reflecting structures with a shared cavity" was invented by Emilie Courjon (Franois, France), Florent Bernard (Besancon, France), Thierry LaRoche (Besancon, France), Julien Garcia (Chamblay, France), Alexandre Clairet (Misereux Salines, France) and Sylvain Ballandras (Besancon, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A resonator device for measuring stress comprises at least two resonators, each resonator comprising an inter-digitated transducer structure arranged b...