US Patent Issued to Skyworks Solutions on Aug. 25 for "Probe card for connecting to contact pads configured to act as probe pads of a semiconductor wafer" (Massachusetts, California Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,721,112, issued on Aug. 25, was assigned to Skyworks Solutions Inc. (Irvine, Calif.).

"Probe card for connecting to contact pads configured to act as probe pads of a semiconductor wafer" was invented by Guillaume Alexandre Blin (Carlisle, Mass.) and Engin Ibrahim Pehlivanoglu (Costa Mesa, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe card for testing or trimming or programming a semiconductor wafer having a first die including a first integrated circuit having a trimmable or programmable component. The probe card includes at least one probe arranged to make electrical contact with a contact pad of a second die arranged adjacent to the fi...