US Patent Issued to SK On on April 14 for "Method and device for determining abnormality in image acquisition equipment" (South Korean Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,829, issued on April 14, was assigned to SK On Co. Ltd. (Seoul, South Korea).

"Method and device for determining abnormality in image acquisition equipment" was invented by Dong Whan Shin (Daejeon, South Korea) and Hye Ju Jang (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to various embodiments, there may be provided a method for determining an abnormality in image acquisition equipment, which includes: acquiring one or more 2-dimensional (2D) images by imaging a specific region; acquiring at least one of an average brightness value, a signal to noise ratio (SNR) value and a contrast to noise ratio (CNR) value for t...