US Patent Issued to SK hynix on Sept. 29 for "Semiconductor system for detecting fail location" (South Korean Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,551, issued on Sept. 29, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Semiconductor system for detecting fail location" was invented by Dong Yoon Ka (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes a memory circuit including a plurality of mats and configured to output first read data having a data sequence identical to a data sequence of pattern data after the start of a read operation during a test operation mode operation and configured to output a fail address including error information of the first read data, and a data processing circuit configured to output the first read dat...