US Patent Issued to SK hynix on June 3 for "Semiconductor devices and semiconductor systems calibrating termination resistance" (South Korean Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,322,470, issued on June 3, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Semiconductor devices and semiconductor systems calibrating termination resistance" was invented by Sang Sic Yoon (Icheon-si, South Korea) and Jung Taek You (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor system according to an embodiment of the present disclosure includes a controller configured to output a command address, a first chip selection signal, and a second chip selection signal, and a semiconductor device, including a first rank and a second rank, configured to receive the command address, the first chip selection signal,...