US Patent Issued to SK hynix on Feb. 24 for "Semiconductor system for monitoring results of determination of duty ratio of data clock signals" (South Korean Inventor)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,562,725, issued on Feb. 24, was assigned to SK hynix Inc. (Icheon-si, South Korea).

"Semiconductor system for monitoring results of determination of duty ratio of data clock signals" was invented by Jung Taek You (Icheon-si Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes a duty ratio determination circuit configured to generate a duty information signal in response to receiving a first data clock signal and a second data clock signal in phase or in reverse phase according to a phase selection signal and determining a duty ratio of the first data clock signal and the second data clock signal during ...