US Patent Issued to SK hynix on Feb. 10 for "Test mode control circuit, semiconductor apparatus and system, and method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,820, issued on Feb. 10, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea).

"Test mode control circuit, semiconductor apparatus and system, and method thereof" was invented by Jin Suk Oh (Gyeonggi-do, South Korea), Young Jae An (Gyeonggi-do, South Korea), Bok Rim Ko (Gyeonggi-do, South Korea), Jae Heung Kim (Gyeonggi-do, South Korea) and Min Wook Oh (Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test mode control circuit includes an encryption circuit and a test mode generating circuit. The encryption circuit encrypts, based on an encryption code, an access code set to generate an encrypted access code set. The test...