US Patent Issued to SK Hynix NAND Product Solutions on May 19 for "Self-corrected low-density parity check (LDPC) with index match" (Canadian Inventor)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,632,172, issued on May 19, was assigned to SK Hynix NAND Product Solutions Corp. (Rancho Cordova, Calif.).

"Self-corrected low-density parity check (LDPC) with index match" was invented by Zion Kwok (Burnaby, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "This application is directed to data validation in an electronic device. The electronic device identifies a set of check nodes associated with a first variable node that corresponds to a data bit in a block of data, and obtains check node data from each of the set of check nodes. Each check node is associated with a set of respective variable nodes including the first variable node, and the check...