ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,163, issued on Feb. 10, was assigned to Singapore University of Technology and Design (Singapore).
"Anomaly detection system and method using invariants for an industrial control system" was invented by Gauthama Raman Mani Iyer Ramani (Singapore) and Aditya Mathur (Singapore).
According to the abstract* released by the U.S. Patent & Trademark Office: "An anomaly detection method includes determining state variables of an industrial control system based on a system design of the industrial control system; determining invariants governing the state variables based on the system design; receiving historical measurement data of the state variables of each invariant from the industria...