US Patent Issued to SILICONCH SYSTEMS PVT on Feb. 10 for "System and method for developing and debugging a silicon production test program for semiconductor devices" (Indian Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,823, issued on Feb. 10, was assigned to SILICONCH SYSTEMS PVT LTD (Bangalore, India).

"System and method for developing and debugging a silicon production test program for semiconductor devices" was invented by Shubham Paliwal (Kanpur, India), Rakesh Kumar Polasa (Bengaluru, India), Burle Naga Satyanarayana (Andhra Pradesh, India), Satish Anand Verkila (Bengaluru, India) and Alagesan Mani (Tamil Nadu, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a method and a system for creating and debugging a silicon production test program for a semiconductor device. The method includes running a pre-silicon test program...