ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,677, issued on Dec. 30, was assigned to Sigray Inc. (Benicia, Calif.).

"Sequential array of x-ray imaging detectors" was invented by Wenbing Yun (Walnut Creek, Calif.), Janos Kirz (Berkeley, Calif.) and Richard Ian Spink (Pleasant Hill, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes a plurality of x-ray imaging detectors having at least a first x-ray imaging detector and a second x-ray imaging detector. The first and second x-ray imaging detectors are configured sequentially along an x-ray beam propagation direction."

The patent was filed on Jan. 16, 2025, under Application No. 19/024,835.

*For further information, inc...