US Patent Issued to SIGMASTAR TECHNOLOGY on Sept. 22 for "Memory device and memory testing" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,744,100, issued on Sept. 22, was assigned to SIGMASTAR TECHNOLOGY LTD. (Xiamen, China).

"Memory device and memory testing" was invented by Cheng Jie Zhu (Xiamen, China), Cheng Hung Tsai (Xiamen, China), Kuei Hung Cheng (Xiamen, China), Chia Ho Pan (Xiamen, China) and Jian Na Shen (Xiamen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory testing method includes the operations of: generating test pattern data, a test address and reference data by a pattern generating circuit; performing a built-in self-test (BIST) according to the test pattern, the test address and the reference data by multiple memory modules to generate multiple test resul...