ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,061, issued on Oct. 20, was assigned to Siemens AG (Munich).
"Method and system for detecting sensor anomalies" was invented by Mitchell Joblin (Surrey, Canada) and Dianna Yee (Vancouver, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "For detecting sensor anomalies, a machine learning model models a material flow in an industrial system, as a hierarchical time series, wherein the hierarchical time series represents a structure of the material flow using a directed acyclic graph with a set of nodes and a set of edges, wherein each node is associated to a time series, and wherein the edges represent parent-child relations where each value of a ...