US Patent Issued to Siemens Industry Software on April 7 for "X-masking for in-system deterministic test" (Polish, American Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,150, issued on April 7, was assigned to Siemens Industry Software Inc. (Plano, Texas).

"X-masking for in-system deterministic test" was invented by Janusz Rajski (West Linn, Ore.), Grzegorz Mrugalski (Swarzedz, Poland), Jerzy Tyszer (Poznan, Poland) and Bartosz Wlodarczak (Swarzedz, Poland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A circuit comprises: scan chains comprising scan cells, the scan chains configured to shift in test patterns, apply the test patterns to the circuit, capture test responses of the circuit, and shift out the test responses; a decompressor configured to decompress compressed test patterns into the test patterns; and a t...