US Patent Issued to Siemens Healthineers on Oct. 14 for "Localization and classification of abnormalities in medical images" (American, German, Swiss Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,444,054, issued on Oct. 14, was assigned to Siemens Healthineers AG (Forchheim, Germany).

"Localization and classification of abnormalities in medical images" was invented by Ali Kamen (Skillman, N.J.), Bin Lou (Princeton Junction, N.J.), Bibo Shi (Monmouth Junction, N.J.), Nicolas Von Roden (St Gallen, Switzerland), Berthold Kiefer (Erlangen, Germany), Robert Grimm (Nuremberg, Germany), Heinrich von Busch (Uttenreuth, Germany), Mamadou Diallo (Plainsboro, N.J.), Tongbai Meng (Ellicott City, Md.), Dorin Comaniciu (Princeton, N.J.), David Jean Winkel (Basel, Switzerland) and Xin Yu (Nashville, Tenn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems ...