US Patent Issued to SIEMENS HEALTHINEERS on July 7 for "Methods for providing second key elements of the examination region in an x-ray image" (German Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,675,882, issued on July 7, was assigned to SIEMENS HEALTHINEERS AG (Forchheim, Germany).

"Methods for providing second key elements of the examination region in an x-ray image" was invented by Ramyar Biniazan (Nuremberg, Germany), Steffen Kappler (Effeltrich, Germany) and Ludwig Ritschl (Buttenheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "One or more example embodiments relates to a computer-implemented method for providing key elements of the examination region in an X-ray image."

The patent was filed on Jan. 12, 2023, under Application No. 18/153,609.

*For further information, including images, charts and tables, please visit: http://p...