US Patent Issued to Siemens Healthineers on Dec. 2 for "Method for slice-specific correction of scan data recorded for at least two slices simultaneously by means of an echo-planar simultaneous multi-slice technique" (German Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,308, issued on Dec. 2, was assigned to Siemens Healthineers AG (Forchheim, Germany).

"Method for slice-specific correction of scan data recorded for at least two slices simultaneously by means of an echo-planar simultaneous multi-slice technique" was invented by Mario Zeller (Erlangen, Germany) and Adam Kettinger (Erlangen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a method for slice-specific correction of scan data recorded for at least two slices simultaneously of an examination object using an EPI-SMS technique, navigator signals encoded in a slice selection direction using a bipolar readout gradient for the at least two slices tem...