US Patent Issued to SIEMENS HEALTHINEERS on Aug. 11 for "Providing a complete set of second key elements in an X-ray image" (German Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,702,373, issued on Aug. 11, was assigned to SIEMENS HEALTHINEERS AG (Forchheim, Germany).

"Providing a complete set of second key elements in an X-ray image" was invented by Ramyar Biniazan (Nuremberg, Germany), Steffen Kappler (Effeltrich, Germany) and Ludwig Ritschl (Buttenheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method comprises: applying a first trained function to first input data to generate first output data, the first output data including first key elements; receiving second input data, the second input data being an X-ray image of an examination region acquired using a first collimation region; applying a second trained f...