ALEXANDRIA, Va., April 15 -- United States Patent no. 12,599,781, issued on April 14, was assigned to SIEMENS HEALTHINEERS INTERNATIONAL AG (Steinhausen, Switzerland).
"Assessing treatment parameters for radiation treatment planning" was invented by Viljo Petaja (Espoo, Finland), Anthony Magliari (Swansea, Ill.), Pierre Lansonneur (Helsinki), Jessica Perez (Geneva), Michiko Rossi (Espoo, Finland) and Michael Folkerts (Carrollton, Texas).
According to the abstract* released by the U.S. Patent & Trademark Office: "Information associated with a radiation treatment plan includes, for example, values of dose per voxel in a target volume, values of dose rate per voxel in the target volume, and values of parameters used when generating the value...