US Patent Issued to Siemens Healthcare Diagnostics on March 3 for "Apparatus and methods of detecting defects in machine vision systems" (New Jersey Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,567,134, issued on March 3, was assigned to Siemens Healthcare Diagnostics Inc. (Tarrytown, N.Y.).

"Apparatus and methods of detecting defects in machine vision systems" was invented by Rayal Raj Prasad Nalam Venkat (Princeton, N.J.), Yao-Jen Chang (Princeton, N.J.), Benjamin S. Pollack (Jersey City, N.J.) and Ankur Kapoor (Plainsboro, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods of identifying a defect in a machine vision system. Embodiments of the method include providing a first imaging device having a first field of view; moving a reflective tool through the first field of view; capturing a plurality of images of the reflective tool a...