ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,358, issued on May 13, was assigned to SHINKAWA LTD. (Tokyo).
"Resistance wire abnormality detection device" was invented by Hiroshi Kikuchi (Tokyo) and Shinsuke Fukumoto (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electric circuit abnormality detection device includes a pulse generator, a directional coupler, and a detection unit. The detection unit includes a reference reflected wave database and a calculation part. The reference reflected wave database stores waveform information of a reference reflected wave inputted from the directional coupler when a pulse signal is inputted to a reference electric circuit that has a same wiring p...