US Patent Issued to SHIMADZU on Sept. 2 for "Optical inspection apparatus and optical inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,214, issued on Sept. 2, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Optical inspection apparatus and optical inspection method" was invented by Takashi Ono (Kyoto, Japan), Masahiro Ihara (Kyoto, Japan), Hiromasa Maruno (Kyoto, Japan), Satoshi Matsuoka (Kyoto, Japan), Eri Matsutani (Kyoto, Japan) and Yusuke Koga (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "One mode of an optical inspection apparatus according to the present invention is an optical inspection apparatus for optically inspecting an object, the optical inspection apparatus including: a biasing section (20) configured to apply, to a group of objects (23A) on a stage, a...