US Patent Issued to SHIMADZU on May 19 for "Chromatography quality control device and chromatography quality control method" (Japanese Inventor)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,601, issued on May 19, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Chromatography quality control device and chromatography quality control method" was invented by Akira Noda (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A chromatography quality control device includes a measurement data acquirer that acquires measurement data obtained as a result of measurement in a chromatograph and stores the measurement data in a storage device, a chromatogram factorizer that retrieves the measurement data from the storage device, dimensionally compresses a chromatogram obtained from the measurement data by factorization and stores component da...