ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,248, issued on July 28, was assigned to SHIMADZU Corp. (Kyoto, Japan).
"Surface analysis method and surface analysis apparatus" was invented by Osamu Furuhashi (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A surface analysis apparatus includes: an ion irradiation unit configured to irradiate a surface of a solid sample with an ion stream of a specific ion species having a preset value of kinetic energy at a predetermined incident angle; an observation unit configured to observe scattered ions that originate from the ion stream and have undergone a charge transfer reaction with an atom or molecule present on a surface of the solid samp...