ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,016, issued on July 21, was assigned to SHIMADZU Corp. (Kyoto, Japan).

"Method for mass spectrometry and mass spectrometer" was invented by Hiroko Ueda (Kyoto, Japan) and Yusuke Tateishi (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A plurality of partial mass-to-charge-ratio ranges are defined so that neighboring partial mass-to-charge-ratio ranges overlap each other at a mass-to-charge ratio of a reference ion (Step 2). Mass spectrometry data of a known compound is acquired in each partial mass-to-charge-ratio range (Steps 3 and 4). A normalization coefficient is determined based on a measured intensity of the reference ion in the m...