US Patent Issued to Shenzhen Hangzhi Precision Electronics on Dec. 2 for "Fluxgate current sensor and current measurement method" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,257, issued on Dec. 2, was assigned to Shenzhen Hangzhi Precision Electronics Co. Ltd. (Shenzhen, China).

"Fluxgate current sensor and current measurement method" was invented by Xinliang Tian (Shenzhen, China), Zhouyang Wan (Shenzhen, China), Yongliang Ding (Shenzhen, China), Baichi Yao (Shenzhen, China), Liang Liu (Shenzhen, China), Chuncai Ye (Shenzhen, China) and Wei Fu (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A fluxgate current sensor and a current measurement method, wherein the fluxgate current sensor includes a magnetic probe and an excitation and detection circuit, and the magnetic probe includes an excitation iron cor...