US Patent Issued to SHENZHEN ADAPS PHOTONICS TECHNOLOGY on Dec. 2 for "Methods and systems for lidar walk error correction" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,341, issued on Dec. 2, was assigned to SHENZHEN ADAPS PHOTONICS TECHNOLOGY Co. LTD. (Shenzhen, China).

"Methods and systems for lidar walk error correction" was invented by Zhijie Ma (Shenzhen, China), Chao Zhang (Shenzhen, China) and Kai Zang (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for walk error correction in a lidar system. A preliminary peak location of a received laser pulsed is compared to a threshold. If the preliminary peak location is within the threshold, walk error correction is applied. A pulse starting point is obtained by locating a predetermined number of consecutive increasing intensity values. A corre...