US Patent Issued to Sesotec on April 14 for "Method for measuring the detection sensitivity of an X-ray device" (Canadian, German Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,695, issued on April 14, was assigned to Sesotec GmbH (Schonberg, Germany).

"Method for measuring the detection sensitivity of an X-ray device" was invented by Reinhard Kurz (Rinchnach, Germany) and Doug Pedersen (Cambridge, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a method for measuring the detection sensitivity of an x-ray device for recognizing foreign matter in a product, the x-ray device having a detector, the detection signal of which results in a detection image having a defined resolution, the detection image being evaluated in order to recognize foreign matter. In a test-body analysis phase, which is u...