US Patent Issued to SEMITEC, National Institute of Technology, HIROSAKI UNIVERSITY on June 23 for "Temperature measurement device, thermometer, temperature measurement method, and temperature attenuation measurement method" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,320, issued on June 23, was assigned to SEMITEC Corp. (Tokyo), National Institute of Technology (Tokyo) and HIROSAKI UNIVERSITY (Aomori, Japan).

"Temperature measurement device, thermometer, temperature measurement method, and temperature attenuation measurement method" was invented by Shigenao Maruyama (Aomori, Japan), Yuya Iseki (Aomori, Japan), Takuma Kogawa (Aomori, Japan), Takashi Nonaka (Aomori, Japan), Yasushi Hosokawa (Aomori, Japan), Takahiro Okabe (Aomori, Japan), Yutaro Tabata (Tokyo), Tadashi Matsudate (Tokyo), Toshinori Nakajima (Tokyo), Masaya Higashi (Tokyo) and Manabu Orito (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A ther...