US Patent Issued to SEMITEC, National Institute of Technology, HIROSAKI UNIVERSITY on Aug. 25 for "Temperature calibration method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,788, issued on Aug. 25, was assigned to SEMITEC Corp. (Tokyo), National Institute of Technology (Tokyo) and HIROSAKI UNIVERSITY (Aomori, Japan).

"Temperature calibration method" was invented by Shigenao Maruyama (Aomori, Japan), Takahiro Okabe (Aomori, Japan), Yuya Iseki (Aomori, Japan), Takashi Nonaka (Aomori, Japan), Takuma Kogawa (Aomori, Japan), Yasushi Hosokawa (Aomori, Japan) and Manabu Orito (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a temperature calibration method that makes it possible to efficiently calibrate temperature in a short time and enhance temperature calibration accuracy. This temperature calibration metho...