US Patent Issued to Semiconductor Energy Laboratory on June 3 for "Learning data generation device and defect identification system" (Japanese Inventors)

ALEXANDRIA, Va., June 4 -- United States Patent no. 12,322,084, issued on June 3, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Atsugi, Japan).

"Learning data generation device and defect identification system" was invented by Tatsuya Okano (Kanagawa, Japan), Ryo Nakazato (Kanagawa, Japan) and Atsuya Tokinosu (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A learning data generation device that can generate learning data suitable for learning of an identification model. The learning data generation device has a function of cutting out part of first image data as second image data, a function of generating a two-dimensional graphic corresponding to the area of the second image data...