US Patent Issued to SEIKO EPSON on Sept. 22 for "Inertial measurement device" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,662, issued on Sept. 22, was assigned to SEIKO EPSON Corp. (Japan).

"Inertial measurement device" was invented by Yasunori Hiyoshi (Suwa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A inertial measurement device includes: a first inertial measurement unit to an n-th inertial measurement unit; a relay circuit configured to receive first detection data to n-th detection data from the first inertial measurement unit to the n-th inertial measurement unit and output the first detection data to the n-th detection data as output data in a time-division manner; and a processing device configured to receive the output data from the relay circuit an...