ALEXANDRIA, Va., March 24 -- United States Patent no. 12,582,317, issued on March 24, was assigned to SEIKO EPSON Corp. (Tokyo).
"Detecting device and measuring apparatus" was invented by Takefumi Fukagawa (Fujimi-machi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A detecting device includes a substrate and a plurality of detecting elements arranged in a matrix at the substrate. Each of the plurality of detecting elements includes a light emitting portion and a light receiving portion that receives light of a wavelength emitted from the light emitting portion at a position adjacent to the light emitting portion. The light receiving portion includes a photoelectric conversion portion formed at the su...