US Patent Issued to SAS Institute on May 13 for "Two-level paralleliztion of goodness-of-fit tests for spatial process models" (North Carolina Inventor)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,299,360, issued on May 13, was assigned to SAS Institute Inc. (Cary, N.C.).

"Two-level paralleliztion of goodness-of-fit tests for spatial process models" was invented by Pradeep Mohan (Cary, N.C.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes processor(s) to: receive a request to test goodness-of-fit of a spatial process model; generate a KD tree from observed spatial point dataset including locations within a region at which instances of an event occurred; derive, from the observed spatial point dataset, multiple quadrats into which the region is divided; receive, from multiple processors, current levels of availability of proces...