US Patent Issued to Sandisk Technologies on May 5 for "Aborted operation detection for nonvolatile memory with non-uniform erase" (American, Japanese Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,450, issued on May 5, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Aborted operation detection for nonvolatile memory with non-uniform erase" was invented by Huiwen Xu (Cupertino, Calif.), Deepanshu Dutta (Fremont, Calif.), Ken Oowada (Fujisawa, Japan), Bo Lei (San Ramon, Calif.), Ravi J. Kumar (Redwood City, Calif.), Sujjatul Islam (San Jose, Calif.) and Xue Pitner (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes one or more control circuits that are configured to connect to a plurality of nonvolatile memory cells. The one or more control circuits are configured to detect a first boundary betwe...