US Patent Issued to Sandisk Technologies on June 30 for "Single-level memory cell error on-chip detection" (California Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,963, issued on June 30, was assigned to Sandisk Technologies Inc (Milpitas, Calif.).

"Single-level memory cell error on-chip detection" was invented by Jiacen Guo (Cupertino, Calif.), Wei Cao (Fremont, Calif.) and Xiang Yang (Santa Clara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory apparatus includes memory cells configured to store a threshold voltage corresponding to one of a plurality of data states. The memory apparatus also includes a control means configured to detect whether data stored in a group of the memory cells as one bit per each of the memory cells has errors. The control means is also configured to bypass error cor...